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产品名称:S500 源测量单元
产品型号:S500
产品厂商:keithley
欲购买或租赁S500 源测量单元
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S500型集成测试系统

S500 Integrated Test Systems are highly configurable, instrument-based systems for semiconductor characterization at the device, wafer, or cassette level. Built on our proven instrumentation, S500 Integrated Test Systems provide innovative measurement features and system flexibility, scalable to your needs. The unique measurement capability, combined with the powerful and flexible Automated Characterization Suite (ACS) software, provides a comprehensive range of applications and features not offered on other comparable systems on the market. Specific capabilities and system configurations include:

Full-range source measurement unit (SMU) instrument specifications, including subfemtoamp measurement, ensure a wide range of measurements on almost any device.

Pulse generation and ultra-fast I-V for memory characterization, charge pumping, singlepulse PIV (charge trap analysis), and PIV sweeps (self-heating avoidance).Low or high channel-count systems, including parallel test, with Keithley's system-enabling and scalable SMU instruments.

High voltage, current, and power source-measure instrumentation for testing devices such as power MOSFETs and display drivers.Switching, probe cards, and cabling take the system all the way to your DUT.

Highly configurable, instrument-based systemIdeal for SMU-per-pin wafer level reliability (WLR) testing, high speed parallel test, die sorting and binning, NBTI, process control monitoring (PCM)Intuitive test setup, data gathering and analysis with ACS softwareKeithley's TSP-Link Technology backplane provides high speed measurement throughputFlexible solution to meet emerging and mature testing needsFull control of automated and semi-automated probersDevelop and execute tests at the device, site, wafer, and cassette level

 

 

 

 

 

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